Lewis, R.
(1997),
Relative Permittivity Measurement of Square Copper-Laminated Substrates Using the Full Sheet Resonance Technique, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed April 28, 2026)
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Relative Permittivity Measurement of Square Copper-Laminated Substrates Using the Full Sheet Resonance Technique
Published
Author(s)
R L. Lewis
Citation
NIST Interagency/Internal Report (NISTIR) - 5053
Report Number
5053
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
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Created December 31, 1996, Updated October 12, 2021