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Relative Permittivity Measurement of Rectangular Copper-Laminated Substrates Using the Full-Sheet Resonance Technique

Published

Author(s)

R L. Lewis
Citation
NIST Interagency/Internal Report (NISTIR) - 5062
Report Number
5062
Volume
5062

Citation

Lewis, R. (1997), Relative Permittivity Measurement of Rectangular Copper-Laminated Substrates Using the Full-Sheet Resonance Technique, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 31, 1997, Updated October 12, 2021