Lewis, R.
(1997),
Relative Permittivity Measurement of Rectangular Copper-Laminated Substrates Using the Full-Sheet Resonance Technique, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed April 26, 2026)
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Relative Permittivity Measurement of Rectangular Copper-Laminated Substrates Using the Full-Sheet Resonance Technique
Published
Author(s)
R L. Lewis
Citation
NIST Interagency/Internal Report (NISTIR) - 5062
Report Number
5062
Volume
5062
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
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Created March 31, 1997, Updated October 12, 2021