Thurber, W.
, Mattis, R.
, and, L.
and Filliben, J.
(1981),
The relationship between resistivity and dopant density for phosphorus-and boron-doped silicon:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-64
(Accessed December 11, 2024)
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The relationship between resistivity and dopant density for phosphorus-and boron-doped silicon:
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- NBS SP 400-64
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NBS SP 400-64
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NIST Pubs
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Created January 1, 1981, Updated May 19, 2023