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Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement

Published

Author(s)

Richard S. Gates, Mark Reitsma

Abstract

Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and precision measurement methods. The purpose of this project is to explore potential cantilever designs as calibration reference artifacts and probes for making precise nanomechanical property measurements.
Citation
Cornell Nanoscale Facility Research Accomplishments

Keywords

AFM, Calibration, Cantilever, Nanomechanical Property, Spring Constant

Citation

Gates, R. and Reitsma, M. (2009), Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement, Cornell Nanoscale Facility Research Accomplishments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902689 (Accessed February 24, 2024)
Created June 11, 2009, Updated February 19, 2017