Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement
Richard S. Gates, Mark Reitsma
Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and precision measurement methods. The purpose of this project is to explore potential cantilever designs as calibration reference artifacts and probes for making precise nanomechanical property measurements.
Cornell Nanoscale Facility Research Accomplishments
and Reitsma, M.
Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement, Cornell Nanoscale Facility Research Accomplishments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902689
(Accessed February 24, 2024)