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Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement



Richard S. Gates, Mark Reitsma


Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and precision measurement methods. The purpose of this project is to explore potential cantilever designs as calibration reference artifacts and probes for making precise nanomechanical property measurements.
Cornell Nanoscale Facility Research Accomplishments


AFM, Calibration, Cantilever, Nanomechanical Property, Spring Constant


Gates, R. and Reitsma, M. (2009), Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement, Cornell Nanoscale Facility Research Accomplishments, [online], (Accessed July 16, 2024)


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Created June 11, 2009, Updated February 19, 2017