Gates, R.
and Reitsma, M.
(2009),
Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement, Cornell Nanoscale Facility Research Accomplishments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=902689
(Accessed December 5, 2024)
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Prototype Cantilevers for AFM Calibration and Nanomechanical Property Measurement
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Abstract
Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and precision measurement methods. The purpose of this project is to explore potential cantilever designs as calibration reference artifacts and probes for making precise nanomechanical property measurements.Citation
Cornell Nanoscale Facility Research Accomplishments
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Others
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Keywords
AFM, Calibration, Cantilever, Nanomechanical Property, Spring Constant
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Created June 11, 2009, Updated February 19, 2017