Chen, W.
, Gentile, T.
, O'donovan, K.
, Borchers, J.
and Majkrzak, C.
(2004),
Polarized Neutron Reflectometry of w Patterned Magnetic Film with w <sup>3</sup>He Analyzer and a Position Sensitive Detector, Review of Scientific Instruments
(Accessed April 26, 2025)
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Polarized Neutron Reflectometry of w Patterned Magnetic Film with w 3He Analyzer and a Position Sensitive Detector
Published
Author(s)
W C. Chen, , K V. O'donovan, J A. Borchers, C F. Majkrzak
Citation
Review of Scientific Instruments
Volume
75
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 2003, Updated October 12, 2021