TY  - JOUR
AU  - W Chen
AU  - Thomas Gentile
AU  - K O'donovan
AU  - J Borchers
AU  - C Majkrzak
C2  - Review of Scientific Instruments
DA  - 2004-01-01 00:01:00
LA  - en
M1  - 75
PB  - Review of Scientific Instruments
PY  - 2004
TI  - Polarized Neutron Reflectometry of w Patterned Magnetic Film with w <sup>3</sup>He Analyzer and a Position Sensitive Detector
ER  -