Gupta, R.
, Kubarych, Z.
, McClelland, J.
and Celotta, R.
(1994),
Pitch Standards via Laser-Focused Deposition, Conference on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, USA
(Accessed September 16, 2024)
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Pitch Standards via Laser-Focused Deposition
Published
Author(s)
, , ,
Conference Dates
March 24-25, 1994
Conference Location
Gaithersburg, MD, USA
Conference Title
Conference on Industrial Applications of Scanned Probe Microscopy
Pub Type
Conferences
Keywords
MICROSCOPY
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1993, Updated October 12, 2021