TY  - CONF
AU  - R Gupta
AU  - Zeina Kubarych
AU  - Jabez McClelland
AU  - Robert Celotta
C2  - Conference on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, USA
DA  - 1994-01-01 00:01:00
LA  - en
PB  - Conference on Industrial Applications of Scanned Probe Microscopy, Gaithersburg, MD, USA
PY  - 1994
TI  - Pitch Standards via Laser-Focused Deposition
ER  -