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Photon-Assisted Tunneling in Electron Pumps

Published

Author(s)

M. Covington, Mark W. Keller, Richard L. Kautz, John M. Martinis

Abstract

We measure photon-assisted tunneling in 4- and 6-junction electron pumps at photon frequencies up to 60 GHz. We determine the microwave voltage at the pumps using noise thermometry. The standard theory of leakage in the electron pump, modified to include photon-assisted tunneling, describes our experiments well. From this test of theory we argue that, in the absence of external microwaves, photon-assisted tunneling driven by 1/f noise is an important error mechanism in electron pumps.
Citation
Physical Review Letters
Volume
84
Issue
22

Keywords

photon frequencies, photon-assisted tunneling

Citation

Covington, M. , Keller, M. , Kautz, R. and Martinis, J. (2000), Photon-Assisted Tunneling in Electron Pumps, Physical Review Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29409 (Accessed February 29, 2024)
Created May 28, 2000, Updated October 12, 2021