Covington, M.
, Keller, M.
, Kautz, R.
and Martinis, J.
(2000),
Photon-Assisted Tunneling in Electron Pumps, Physical Review Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29409
(Accessed March 3, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Photon-Assisted Tunneling in Electron Pumps
Published
Author(s)
M. Covington, , ,
Abstract
We measure photon-assisted tunneling in 4- and 6-junction electron pumps at photon frequencies up to 60 GHz. We determine the microwave voltage at the pumps using noise thermometry. The standard theory of leakage in the electron pump, modified to include photon-assisted tunneling, describes our experiments well. From this test of theory we argue that, in the absence of external microwaves, photon-assisted tunneling driven by 1/f noise is an important error mechanism in electron pumps.Citation
Physical Review Letters
Volume
84
Issue
22
Pub Type
Journals
Download Paper
Keywords
photon frequencies, photon-assisted tunneling
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created May 28, 2000, Updated October 12, 2021