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The OOF Manual: Version 1.0

Published

Author(s)

W C. Carter, Stephen A. Langer, Lin-Sien H. Lum

Abstract

OOF and PPM200F are programs developed at NIST to investigate the properties of microstructures. The user starts with an image of a real or simulated microstructure, assigns material properties to the features in the image, and performs virtual experiments to determine the properties of the whole material. This manual describes OOF, the part of the package that performs the virtual experiments.
Citation
NIST Interagency/Internal Report (NISTIR) - 6256
Report Number
6256

Keywords

computer software, finite element, material microstructure, software

Citation

Carter, W. , Langer, S. and Lum, L. (1998), The OOF Manual: Version 1.0, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed December 1, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 31, 1998, Updated October 12, 2021