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OBIC Analysis of Stressed, Thermally Isolated Polysilicon Resistors

Published

Author(s)

E. I. Cole, John S. Suehle, K. A. Peterson, P Chaparala, A. N. Campbell, E. S. Snyder, D T. Pierce
Proceedings Title
Proc., 1995 International Reliability Physics Symposium
Conference Dates
April 3-6, 1995
Conference Location
Las Vegas, NV, USA

Citation

Cole, E. , Suehle, J. , Peterson, K. , Chaparala, P. , Campbell, A. , Snyder, E. and Pierce, D. (1995), OBIC Analysis of Stressed, Thermally Isolated Polysilicon Resistors, Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA (Accessed December 3, 2023)
Created December 30, 1995, Updated October 12, 2021