TY  - CONF
AU  - Cole, E.
AU  - Suehle, John
AU  - Peterson, K.
AU  - Chaparala, P
AU  - Campbell, A.
AU  - Snyder, E.
AU  - Pierce, D
C2  - Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA
DA  - 1995-12-31 00:12:00
LA  - en
PB  - Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA
PY  - 1995
TI  - OBIC Analysis of Stressed, Thermally Isolated Polysilicon Resistors
ER  -