@conference{766276,
  author = {E. Cole and John Suehle and K. Peterson and P Chaparala and A. Campbell and E. Snyder and D Pierce},
  title = {OBIC Analysis of Stressed, Thermally Isolated Polysilicon Resistors},
  year = {1995},
  month = {1995-12-31 00:12:00},
  publisher = {Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA},
  language = {en},
}