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PUBLICATIONS

NIST Special Database 302: Nail to Nail Fingerprint Challenge

Published

Author(s)

Gregory P. Fiumara, Patricia A. Flanagan, John D. Grantham, Kenneth Ko, Karen Marshall, Matthew Schwarz, Elham Tabassi, Bryan Woodgate, Christopher Boehnen

Abstract

In September 2017, the Intelligence Advanced Research Projects Activity (IARPA) held a data collection as part of its Nail to Nail (N2N) Fingerprint Challenge. Participating Challengers deployed devices designed to collect an image of the full nail to nail surface area of a fingerprint–equivalent to a rolled fingerprint–from an unacclimated user, without assistance from a trained operator. Traditional operator-assisted live-scan rolled fingerprints were also captured, along with assorted other friction ridge live-scan and latent captures. The collection of images collected during the N2N Fingerprint Challenge, entitled Special Database 302 (SD 302), can be freely downloaded from the National Institute of Standards and Technology (NIST) website.
Citation
Technical Note (NIST TN) - 2007
Report Number
2007
NIST Pub Series
Technical Note (NIST TN)
Pub Type
NIST Pubs

Download Paper

DOI Link

Keywords

biometrics, data, devices, fingerprints, images, latent
Reference data and Biometrics

Citation

Fiumara, G. , Flanagan, P. , Grantham, J. , Ko, K. , Marshall, K. , Schwarz, M. , Tabassi, E. , Woodgate, B. and Boehnen, C. (2019), NIST Special Database 302: Nail to Nail Fingerprint Challenge, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.2007 (Accessed April 24, 2024)

Created December 11, 2019