TY  - GEN
AU  - Gregory Fiumara
AU  - Patricia Flanagan
AU  - John Grantham
AU  - Kenneth Ko
AU  - Karen Marshall
AU  - Matthew Schwarz
AU  - Elham Tabassi
AU  - Bryan Woodgate
AU  - Christopher Boehnen
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-12-11
DO  - https://doi.org/10.6028/NIST.TN.2007
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - NIST Special Database 302: Nail to Nail Fingerprint Challenge
ER  -