Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

New Test Structure for Nanometer-Level Overlay and Feature-Placement Metrology

Published

Author(s)

Michael W. Cresswell, Richard A. Allen, Loren W. Linholm, Colleen E. Hood, William B. Penzes
Citation
IEEE Transactions on Semiconductor Manufacturing
Volume
7
Issue
3

Citation

Cresswell, M. , Allen, R. , Linholm, L. , Hood, C. and Penzes, W. (1994), New Test Structure for Nanometer-Level Overlay and Feature-Placement Metrology, IEEE Transactions on Semiconductor Manufacturing (Accessed December 5, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 31, 1994, Updated October 12, 2021