A New Technique to Extract TDDB Acceleration Parameters From Fast Qbd Tests
Y Chen, John S. Suehle, B. Shen, J B. Bernstein, C. Messick, P Chaparala
A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.
, Suehle, J.
, Shen, B.
, Bernstein, J.
, Messick, C.
and Chaparala, P.
A New Technique to Extract TDDB Acceleration Parameters From Fast Q<sub>bd</sub> Tests, Proc., 1997 Integrated Reliability Workshop, Lake Tahoe, CA, USA
(Accessed December 1, 2023)