TY - CONF AU - Chen, Y AU - Suehle, John AU - Shen, B. AU - Bernstein, J AU - Messick, C. AU - Chaparala, P C2 - Proc., 1997 Integrated Reliability Workshop, Lake Tahoe, CA, USA DA - 1998-12-31 00:12:00 LA - en PB - Proc., 1997 Integrated Reliability Workshop, Lake Tahoe, CA, USA PY - 1998 TI - A New Technique to Extract TDDB Acceleration Parameters From Fast Qbd Tests ER -