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Modeling electromigration using the peridynamics approach



David T. Read, Walter Gerstle, Vinod K. Tewary


This chapter presents a summary of the information and reasoning needed to justify learning about peridynamics for the purpose of analyzing electromigration and provides guidance for the development of a complete peridynamics analysis. The additions needed to convert the original peridynamics model as developed for mechanics problems to a multiphysics model capable of treating electromigration are reviewed. Experimental data on void drift by electromigration are introduced to provide a specific target for a demonstration of the peridynamical approach. Model results for the basic phenomena of this experiment are presented. The peridynamics approach appears capable of simultaneously accommodating both constitutive laws and explicit treatment of multi-body interactions, for handling different aspects of the behavior of the material system to be modeled.
Electromigration in Thin Films and Electronic Devices: Materials and Reliability
Publisher Info
Woodhead Publishing Limited, Cambridge, -1


Electromigration, interconnect, interface, modeling, peridynamics, theory, voids.


Read, D. , Gerstle, W. and Tewary, V. (2011), Modeling electromigration using the peridynamics approach, Electromigration in Thin Films and Electronic Devices: Materials and Reliability, Woodhead Publishing Limited, Cambridge, -1 (Accessed June 12, 2024)


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Created August 28, 2011, Updated February 19, 2017