TY  - CHAP
AU  - David Read
AU  - Walter Gerstle
AU  - Vinod Tewary
C2  - Electromigration in Thin Films and Electronic Devices: Materials and Reliability, Woodhead Publishing Limited, Cambridge, -1
DA  - 2011-08-28
LA  - en
PB  - Electromigration in Thin Films and Electronic Devices: Materials and Reliability, Woodhead Publishing Limited, Cambridge, -1
PY  - 2011
TI  - Modeling electromigration using the peridynamics approach
ER  -