Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Modeling the Effect of Finite Size Gratings on Scatterometry Measurements

Published

Author(s)

Elizabeth Kenyon, Michael W. Cresswell, Heather Patrick, Thomas Germer

Abstract

The interpretation of scatterometry measurements generally assumes that the grating extends over an area large enough to intercept all the illumination provided by an incident beam.  However, in practice, the grat-ings used in scatterometry are relatively small.  Thus, the detected light also includes both that scattered by the grating as well as that from a region surrounding the grating because, generally, the incident beam illumi-nates both the grating and the surrounding region.  To model the effects of such real structures, simulations of the effective reflectance were performed whereby the reflection from the grating was considered to be the sum of the diffraction by the grating and the diffraction of the surrounding region, taking into account the beam profile.  To demonstrate the model, the illumination field was assumed to be Gaussian.  Results are shown for a specific target design consisting of a 50 µm square measured by normal incidence reflectometry. Significant errors occur when the incident profile has wings that fall outside of the profile and when the scat-tered light is partially apertured.
Proceedings Title
Proceedings of SPIE Advanced Lithography
Conference Dates
February 24-29, 2008
Conference Location
San Jose, CA, USA
Conference Title
SPIE Advanced Lithography

Citation

Kenyon, E. , Cresswell, M. , Patrick, H. and Germer, T. (2008), Modeling the Effect of Finite Size Gratings on Scatterometry Measurements, Proceedings of SPIE Advanced Lithography, San Jose, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32956 (Accessed February 25, 2024)
Created February 24, 2008, Updated October 12, 2021