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PUBLICATIONS

Microelectronic test patterns NBS-12 and NBS-24:

Published

Author(s)

G P Carver, R L Mattis, M G Buehler
Citation
- NBS IR 81-2234
Report Number
NBS IR 81-2234
Pub Type
NIST Pubs

Download Paper

DOI Link

Citation

Carver, G. , Mattis, R. and Buehler, M. (1981), Microelectronic test patterns NBS-12 and NBS-24:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.81-2234 (Accessed May 4, 2024)

Created January 1, 1981, Updated May 19, 2023