Carver, G.
, Mattis, R.
and Buehler, M.
(1981),
Microelectronic test patterns NBS-12 and NBS-24:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.81-2234
(Accessed December 14, 2024)
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Microelectronic test patterns NBS-12 and NBS-24:
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, ,
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- NBS IR 81-2234
Report Number
NBS IR 81-2234
Pub Type
NIST Pubs
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Created January 1, 1981, Updated May 19, 2023