@misc{1181116, author = {G P Carver and R L Mattis and M G Buehler}, title = {Microelectronic test patterns NBS-12 and NBS-24:}, year = {1981}, month = {1981-01-01 05:01:00}, publisher = {, National Institute of Standards and Technology, Gaithersburg, MD}, doi = {https://doi.org/10.6028/NBS.IR.81-2234}, language = {en}, }