TY  - GEN
AU  - G P Carver
AU  - R L Mattis
AU  - M G Buehler
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1981-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.IR.81-2234
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1981
TI  - Microelectronic test patterns NBS-12 and NBS-24:
ER  -