Buehler, M.
(1974),
Microelectronic test patterns:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-6
(Accessed December 9, 2023)
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Microelectronic test patterns:
Published
Author(s)
Citation
- NBS SP 400-6
Report Number
NBS SP 400-6
Pub Type
NIST Pubs
Download Paper
Citation
Created January 1, 1974, Updated May 19, 2023