TY  - GEN
AU  - Martin G Buehler
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1974-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.400-6
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1974
TI  - Microelectronic test patterns:
ER  -