@misc{1161731,
  author = {Martin G Buehler},
  title = {Microelectronic test patterns:},
  year = {1974},
  month = {1974-01-01 05:01:00},
  publisher = {, National Institute of Standards and Technology, Gaithersburg, MD},
  doi = {https://doi.org/10.6028/NBS.SP.400-6},
  language = {en},
}