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Metrology For Organic Monolayers On Cobalt Surfaces

Published

Author(s)

Sujitra J. Pookpanratana, Leigh K. Lydecker, Hyuk-Jae Jang, Curt A. Richter, Christina A. Hacker
Conference Dates
March 25-28, 2013
Conference Location
Gaithersburg, MD
Conference Title
FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2013

Keywords

Molecular layer, self-assembly, ferromagnetic materials

Citation

Pookpanratana, S. , Lydecker, L. , Jang, H. , Richter, C. and Hacker, C. (2013), Metrology For Organic Monolayers On Cobalt Surfaces, FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2013, Gaithersburg, MD (Accessed September 17, 2021)
Created March 27, 2013, Updated February 19, 2017