TY  - CONF
AU  - Sujitra Pookpanratana
AU  - Leigh Lydecker
AU  - Hyuk-Jae Jang
AU  - Curt Richter
AU  - Christina Hacker
C2  - FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2013, Gaithersburg, MD
DA  - 2013-03-27
LA  - en
PB  - FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2013, Gaithersburg, MD
PY  - 2013
TI  - Metrology For Organic Monolayers On Cobalt Surfaces
ER  -