Reader, J.
(2002),
Metrological implications of recent interferometric wavelength measurements for singly ionized silicon in the vacuum ultraviolet (152 nm and 180 nm), Metrologia
(Accessed April 25, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Metrological implications of recent interferometric wavelength measurements for singly ionized silicon in the vacuum ultraviolet (152 nm and 180 nm)
Published
Author(s)
Citation
Metrologia
Volume
39
Pub Type
Journals
Citation
Created January 1, 2002, Updated February 17, 2017