TY  - JOUR
AU  - Joseph Reader
C2  - Metrologia
DA  - 2002-01-01
LA  - en
M1  - 39
PB  - Metrologia
PY  - 2002
TI  - Metrological implications of recent interferometric wavelength measurements for singly ionized silicon in the vacuum ultraviolet (152 nm and 180 nm)
ER  -