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Metrological Implications of Recent Interferometric Wavelength Measurements for Singly Ionized Silicon in the Vacuum Ultraviolet (152 nm and 180 nm)

Published

Author(s)

Joseph Reader

Abstract

Recent measurements of the wavelengths of two resonance transitions in singly-ionized silicon, Si II, by Griesmann and Kling, Astrophys. J., 2000, 536, L113 provide a comparison of wavelength scales derived from standard Cd, Hg and Kr lamps and the new scale derived from heterodyne frequency measurements combined with the adopted value for the speed of light.
Citation
Metrologia
Volume
39
Issue
No. 4

Keywords

fourier transform spectrometry, heterodyne, singly-ionized silicon, wavelength standards

Citation

Reader, J. (2002), Metrological Implications of Recent Interferometric Wavelength Measurements for Singly Ionized Silicon in the Vacuum Ultraviolet (152 nm and 180 nm), Metrologia (Accessed April 13, 2024)
Created January 1, 2002, Updated February 17, 2017