@article{175381,
  author = {Joseph Reader},
  title = {Metrological Implications of Recent Interferometric Wavelength Measurements for Singly Ionized Silicon in the Vacuum Ultraviolet (152 nm and 180 nm)},
  year = {2002},
  number = {39},
  month = {2002-01-01},
  publisher = {Metrologia},
  language = {en},
}