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Measuring the Mechanical Properties of a Thin Polymeric Film by AFM

Published

Author(s)

P M. McGuiggan, D J. Yarusso

Abstract

The atomic force microscope is used to measure the tan delta (loss modulus/storate modulus) of a thin film of poly(n-butylacrylate) as a function of frequency. The AFM results are in good agreement with indenter measurements. The results demonstrate that the AFM technique can quantitatively measure rheological properties of soft thin polymeric films.
Citation
Polymer Preprints
Volume
88

Keywords

AFM, atomic force microscopy, mechanical properties, nanomechanics, poly(n-butylacrylate), thin films

Citation

McGuiggan, P. and Yarusso, D. (2003), Measuring the Mechanical Properties of a Thin Polymeric Film by AFM, Polymer Preprints, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852142 (Accessed May 30, 2024)

Issues

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Created January 1, 2003, Updated February 19, 2017