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Measurement of the Local Diattenuation and Retardance of Thin Polymer Films Using Near-Field Polarimetry

Published

Author(s)

Lori S. Goldner, Michael J. Fasolka, S N. Goldie

Abstract

Near-field scanning optical microscopy and Fourier analysis polarimetry are combined to obtain quantitative maps of the local retardance, (resulting from strain or crystalline birefringence), fast axis orientation, diattenuation and diattenuating axis orientation in nanostructured polymer thin films. Lateral resolution of 50 nm with retardance sensitivity as small as 1 mrad has been demonstrated in images of isotactic PS crystallites and diblock copolymer morphologies.
Citation
Acs Symposium Series
Volume
897

Keywords

diblock copolymer, near-field, near-field scanning optical microscopy, NSOM, polarimetry, polymer, polymer crystals, SNOM, thin films

Citation

Goldner, L. , Fasolka, M. and Goldie, S. (2005), Measurement of the Local Diattenuation and Retardance of Thin Polymer Films Using Near-Field Polarimetry, Acs Symposium Series (Accessed April 23, 2024)
Created January 1, 2005, Updated February 17, 2017