U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Measurement of the Local Diattenuation and Retardance of Thin Polymer Films Using Near-Field Polarimetry

Published

Author(s)

Lori S. Goldner, Michael J. Fasolka, S N. Goldie

Abstract

Near-field scanning optical microscopy and Fourier analysis polarimetry are combined to obtain quantitative maps of the local retardance, (resulting from strain or crystalline birefringence), fast axis orientation, diattenuation and diattenuating axis orientation in nanostructured polymer thin films. Lateral resolution of 50 nm with retardance sensitivity as small as 1 mrad has been demonstrated in images of isotactic PS crystallites and diblock copolymer morphologies.
Citation
Acs Symposium Series
Volume
897
Pub Type
Journals

Keywords

diblock copolymer, near-field, near-field scanning optical microscopy, NSOM, polarimetry, polymer, polymer crystals, SNOM, thin films

Citation

Goldner, L. , Fasolka, M. and Goldie, S. (2005), Measurement of the Local Diattenuation and Retardance of Thin Polymer Films Using Near-Field Polarimetry, Acs Symposium Series (Accessed December 8, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2005, Updated February 17, 2017