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PUBLICATIONS

Measurement for Controlling Electromigration in Metallization Interconnects: Today and Tomorrow

Published

Author(s)

Harry A. Schafft, John S. Suehle, J. A. Lechner
Proceedings Title
Proc., Sixth International Conference on Interconnection Technology in Electronics
Conference Dates
February 18-20, 1992
Conference Location
Fellbach, 1, GM
Pub Type
Conferences

Citation

Schafft, H. , Suehle, J. and Lechner, J. (1992), Measurement for Controlling Electromigration in Metallization Interconnects: Today and Tomorrow, Proc., Sixth International Conference on Interconnection Technology in Electronics, Fellbach, 1, GM (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1992, Updated October 12, 2021
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