@conference{780116,
  author = {Harry Schafft and John Suehle and J. Lechner},
  title = {Measurement for Controlling Electromigration in Metallization Interconnects: Today and Tomorrow},
  year = {1992},
  month = {1992-12-31 00:12:00},
  publisher = {Proc., Sixth International Conference on Interconnection Technology in Electronics, Fellbach, 1, GM},
  language = {en},
}