TY  - CONF
AU  - Schafft, Harry
AU  - Suehle, John
AU  - Lechner, J.
C2  - Proc., Sixth International Conference on Interconnection Technology in Electronics, Fellbach, 1, GM
DA  - 1992-12-31 00:12:00
LA  - en
PB  - Proc., Sixth International Conference on Interconnection Technology in Electronics, Fellbach, 1, GM
PY  - 1992
TI  - Measurement for Controlling Electromigration in Metallization Interconnects: Today and Tomorrow
ER  -