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Massively Parallel TDDB testing : SiC Power devices

Published

Author(s)

Zakariae Chbili, Jaafar Chbili, Jason P. Campbell, Jason T. Ryan, M Lahbabi, D Ioannou, Kin P. Cheung
Proceedings Title
2015 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 11-22, 2015
Conference Location
South Lake Tahoe, CA
Conference Title
2015 IEEE International Integrated Reliability Workshop

Citation

Chbili, Z. , Chbili, J. , Campbell, J. , Ryan, J. , Lahbabi, M. , Ioannou, D. and Cheung, K. (2016), Massively Parallel TDDB testing : SiC Power devices, 2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA (Accessed July 6, 2022)
Created January 14, 2016, Updated September 6, 2018