Chbili, Z.
, Chbili, J.
, Campbell, J.
, Ryan, J.
, Lahbabi, M.
, Ioannou, D.
and Cheung, K.
(2016),
Massively Parallel TDDB testing : SiC Power devices, 2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA
(Accessed October 9, 2024)
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Massively Parallel TDDB testing : SiC Power devices
Published
Author(s)
, , , , M Lahbabi, D Ioannou,
Proceedings Title
2015 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 11-22, 2015
Conference Location
South Lake Tahoe, CA
Conference Title
2015 IEEE International Integrated Reliability Workshop
Pub Type
Conferences
Citation
Issues
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Created January 14, 2016, Updated September 6, 2018