Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Massively Parallel TDDB testing : SiC Power devices

Published

Author(s)

Zakariae Chbili, Jaafar Chbili, Jason P. Campbell, Jason T. Ryan, M Lahbabi, D Ioannou, Kin P. Cheung
Proceedings Title
2015 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 11-22, 2015
Conference Location
South Lake Tahoe, CA
Conference Title
2015 IEEE International Integrated Reliability Workshop

Citation

Chbili, Z. , Chbili, J. , Campbell, J. , Ryan, J. , Lahbabi, M. , Ioannou, D. and Cheung, K. (2016), Massively Parallel TDDB testing : SiC Power devices, 2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA (Accessed June 22, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 14, 2016, Updated September 6, 2018