@conference{218971,
  author = {Zakariae Chbili and Jaafar Chbili and Jason Campbell and Jason Ryan and M Lahbabi and D Ioannou and Kin Cheung},
  title = {Massively Parallel TDDB testing : SiC Power devices},
  year = {2016},
  month = {2016-01-14},
  publisher = {2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA},
  language = {en},
}