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A manual wafer probe station for an integrated circuit test system:

Published

Author(s)

G P Carver, W A Cullins
Citation
- NBS SP 400-68
Report Number
NBS SP 400-68

Citation

Carver, G. and Cullins, W. (1981), A manual wafer probe station for an integrated circuit test system:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-68 (Accessed February 25, 2024)
Created January 1, 1981, Updated May 19, 2023