Carver, G.
and Cullins, W.
(1981),
A manual wafer probe station for an integrated circuit test system:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.SP.400-68
(Accessed March 13, 2025)
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A manual wafer probe station for an integrated circuit test system:
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- NBS SP 400-68
Report Number
NBS SP 400-68
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NIST Pubs
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Created January 1, 1981, Updated May 19, 2023