Khera, D.
, Cresswell, M.
, Linholm, L.
, Ramanathan, G.
, Buzzeo, J.
and Nagarajan, A.
(1990),
Knowledge Extraction Techniques for Expert System Assisted Wafer Screening, Proc., International Semiconductor Manufacturing Science Symposium, Burlingame, CA, USA
(Accessed April 26, 2024)
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Knowledge Extraction Techniques for Expert System Assisted Wafer Screening
Published
Author(s)
D. Khera, , , G. Ramanathan, J. Buzzeo, A. Nagarajan
Proceedings Title
Proc., International Semiconductor Manufacturing Science Symposium
Conference Dates
May 21-23, 1990
Conference Location
Burlingame, CA, USA
Pub Type
Conferences
Citation
Created December 30, 1990, Updated October 12, 2021