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Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry

Published

Author(s)

Nhan Van Nguyen, Joseph G. Pellegrino, Paul M. Amirtharaj, David G. Seiler, S. B. Qadri
Citation
Journal of Applied Physics
Volume
73
Issue
11

Citation

Nguyen, N. , Pellegrino, J. , Amirtharaj, P. , Seiler, D. and Qadri, S. (1993), Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry, Journal of Applied Physics (Accessed April 15, 2024)
Created May 31, 1993, Updated October 12, 2021