Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Instantaneous Trapping and Long Term Cell Survival Under Dielectrophoretic Conditions Using a Hybrid Cell Adhesive Surface

Published

Author(s)

Darwin R. Reyes-Hernandez, Jennifer S. Hong, John T. Elliott, Michael Gaitan

Abstract

A dielectrophoresis (DEP) microfluidic device that allows instantaneous trapping of cells for rapid return to cell growth conditions (within 5 minutes) and long-term cell experiments (cell proliferation, induction and differentiation) of embryonic P19 cells is presented. A hybrid cell adhesive material (HCAM) comprised of a positively charged polyelectrolyte, polyallylamine hydrochloride (PAH), and fibronectin (FN), is deposited onto DEP electrodes to serve as an adhesive material for the DEP-trapped cells. Cells adhere onto the HCAM and under flow conditions, do not detach from the surface when DEP forces are removed.
Proceedings Title
Proceedings of Micro Total Analysis Systems 2010, Chemical and Biological Microsystems Society
Conference Dates
October 3-7, 2010
Conference Location
Groningen
Conference Title
The 14th International Conference on Miniaturized Systems for Chemistry and Life Sciences

Keywords

dielectrophoresis, hybrid cell adhesive material, cell trapping, long-term cell assays

Citation

Reyes-Hernandez, D. , Hong, J. , Elliott, J. and Gaitan, M. (2010), Instantaneous Trapping and Long Term Cell Survival Under Dielectrophoretic Conditions Using a Hybrid Cell Adhesive Surface, Proceedings of Micro Total Analysis Systems 2010, Chemical and Biological Microsystems Society, Groningen, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=906185 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 3, 2010, Updated February 19, 2017