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John H. Burnett, Eric C. Benck, Simon G. Kaplan, Erik Stover, Adam Phenis
Abstract
Measurements of the index of refraction of a sample of high-quality, single-crystal germanium using the minimum deviation refractometry method are presented for temperatures near 22 degC and for wavelengths in the range 2 micron to 14 micron. The standard uncertainty for the measurements ranges from 1.5 x 10^-5 to 4.2 x 10^-5, generally increasing with wavelength. A Sellmeier formula fitting the data for this range is provided. Details of the custom system and procedures are presented, along with a detailed analysis of the uncertainty. These results are compared with previous measurements.
Burnett, J.
, Benck, E.
, Kaplan, S.
, Stover, E.
and Phenis, A.
(2020),
Index of refraction of germanium, Applied Optics, [online], https://doi.org/10.1364/AO.382408
(Accessed May 29, 2023)