Burnett, J.
, Gupta, R.
, Griesmann, U.
and Jou, T.
(1999),
Index of Refraction and its Temperature Dependence of Calcium Fluoride Near 157 nm, ed. by Luc Van den Hove, Optical Microlithography XII Proc SPIE 3679
(Accessed September 19, 2024)
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Index of Refraction and its Temperature Dependence of Calcium Fluoride Near 157 nm, ed. by Luc Van den Hove
Published
Author(s)
John H. Burnett, , U Griesmann, T E. Jou
Citation
Optical Microlithography XII Proc SPIE 3679
Volume
3679
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 1999, Updated February 17, 2017