NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Index of Refraction and its Temperature Dependence of Calcium Fluoride Near 157 nm, ed. by Luc Van den Hove

Published

Author(s)

John H. Burnett, R Gupta, U Griesmann, T E. Jou
Citation
Optical Microlithography XII Proc SPIE 3679
Volume
3679
Pub Type
Journals

Citation

Burnett, J. , Gupta, R. , Griesmann, U. and Jou, T. (1999), Index of Refraction and its Temperature Dependence of Calcium Fluoride Near 157 nm, ed. by Luc Van den Hove, Optical Microlithography XII Proc SPIE 3679 (Accessed October 24, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 1999, Updated February 17, 2017
Was this page helpful?