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HgCdTe detector reliability study for the GOES Program:

Published

Author(s)

David G Seiler, George G Harman, Jeremiah R Lowney, Santos Mayo, Walter S Jr Liggett
Citation
- NIST IR 4687
Report Number
NIST IR 4687

Citation

Seiler, D. , Harman, G. , Lowney, J. , Mayo, S. and Liggett, W. (1991), HgCdTe detector reliability study for the GOES Program:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.4687 (Accessed December 10, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 1991, Updated May 19, 2023