TY  - GEN
AU  - Seiler, David G
AU  - Harman, George G
AU  - Lowney, Jeremiah R
AU  - Mayo, Santos
AU  - Liggett, Walter S Jr
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1991-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.4687
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1991
TI  - HgCdTe detector reliability study for the GOES Program:
ER  -