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Hardness Assurance Testing of Bipolar Junction Transistors at Elevated Irradiation Temperatures

Published

Author(s)

S C. Witczak, R D. Schrimpf, D M. Fleetwood, K F. Galloway, R C. Lacoe, D C. Mayer, James M. Puhl, R L. Pease, John S. Suehle
Citation
IEEE Transactions on Nuclear Science
Volume
44
Issue
6

Citation

Witczak, S. , Schrimpf, R. , Fleetwood, D. , Galloway, K. , Lacoe, R. , Mayer, D. , Puhl, J. , Pease, R. and Suehle, J. (1997), Hardness Assurance Testing of Bipolar Junction Transistors at Elevated Irradiation Temperatures, IEEE Transactions on Nuclear Science (Accessed April 19, 2024)
Created December 31, 1996, Updated October 12, 2021