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PUBLICATIONS

Frontiers of Characterization and Metrology for Nanoelectronics: 2013

Published

Author(s)

Erik M. Secula, David G. Seiler
Proceedings Title
Frontiers of Characterization and Metrology for Nanoelectronics: 2013
Conference Dates
March 26-28, 2013
Conference Location
Gaithersburg, MD
Conference Title
2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Pub Type
Conferences
Nanotechnology and Nanometrology

Citation

Secula, E. and Seiler, D. (2013), Frontiers of Characterization and Metrology for Nanoelectronics: 2013, Frontiers of Characterization and Metrology for Nanoelectronics: 2013, Gaithersburg, MD (Accessed April 25, 2024)

Created March 26, 2013, Updated February 19, 2017